| dc.contributor.author | Nurjuliana, Juhari | |
| dc.contributor.author | Wan Haliza, Abd. Majid | |
| dc.contributor.author | Zainol Abidin, Ibrahim | |
| dc.date.accessioned | 2009-08-06T10:09:18Z | |
| dc.date.available | 2009-08-06T10:09:18Z | |
| dc.date.issued | 2006 | |
| dc.identifier.citation | p.112-115 | en_US |
| dc.identifier.issn | 4266580 | |
| dc.identifier.uri | http://ieeexplore.ieee.org/xpls/abs_all.jsp?=&arnumber=4266580 | |
| dc.identifier.uri | http://dspace.unimap.edu.my/123456789/6683 | |
| dc.description | Link to publisher's homepage at http://ieeexplore.ieee.org | en_US |
| dc.description.abstract | The degradation process of a single layer electroluminescence (EL) polymer MEH-PPV organic light emitting diode (OLED) with the MEH-PPV thickness of 57plusmn3 nm is discussed. Typical structure of OLED fabrication is Al/MEH-PPV/ITO (indium tin oxide). Electroluminescence (EL) spectrum indicates that the emission of MEH-PPV device is the yellow orange color. The device degrades by days as demonstrated by the increased in the turn on voltage obtained from I/V curves. The scanning electron microscope (SEM) images show some bubbles emerge on the surface of the device after an electric field was applied to it. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Institute of Electrical and Electronics Engineering (IEEE) | en_US |
| dc.relation.ispartofseries | Proceedings of IEEE International Conference on Semiconductor Electronics (ICSE 2006) | en_US |
| dc.subject | Electroluminescences | en_US |
| dc.subject | Scanning electron microscopy (SEM) | en_US |
| dc.subject | Organic light emitting diodes | en_US |
| dc.subject | Light emitting diodes | en_US |
| dc.subject | Semiconductors | en_US |
| dc.title | Degradation of single layer MEH-PPV organic light emitting diode (OLED) | en_US |
| dc.type | Article | en_US |
