Now showing items 1-20 of 181

    • Dual frequency integrated antenna (DFIA) with image rejection 

      Widad, Ismail; Sohiful Anuar, Zainol Murad (Institute of Electrical and Electronics Engineers (IEEE), 2005)
      A new configuration of integrated antenna featuring dual frequency operations and image frequency rejection is implemented. The used of dual frequency for image rejection in one system by using one antenna is a new technique ...
    • Far-infrared optical transmission through asymmetrical ferroelectric films 

      Mohamad Nazri, Abdul Halif (Research India Publications, 2005)
      Investigation of far-infrared (FIR) spectroscopy for symmetrical ferroelectric (FE) films are discussed theoretically based on the basis of the Tilley-Zeks (TZ) model using Landau free energy expansion, Landau- Khalatnikov ...
    • Oscillatory dynamical switching system of bulk ferroelectrics 

      Mohamad Nazri, Abdul Halif; S. Daud; Junaidah Osman (Science Publications, 2005)
      This study gives a detailed account of calculation of the bulk ferroelectric (FE) oscillatory dynamical system switching for first and second-order phase transition, respectively. All the formalism is delineated in the ...
    • The physics of Tsunami: basic understanding of the Indian Ocean disaster 

      Mohamad Nazri, Abdul Halif; Sharifah Norfaezah, Sabki (Science Publications, 2005)
      This study gives a simple physics explanation behind the Indian Ocean earthquake, called December 26th‘s Tsunami. The explanation based on physics energy conservation and wave properties have been used to understand this ...
    • The surface characteristics of under bump metallurgy (UBM) in electroless nickel immersion gold (ENIG) deposition 

      Mohd Khairuddin, Md Arshad; Ibrahim, Ahmad; Azman, Jalar; Ghazali, Omar (Elsevier Science, 2006)
      This paper discusses on the surface characteristics of each of the seven set-up process steps prior completion of under bump metallurgy (UBM) deposition. The Atomic Force Microscopy (AFM) and Scanning Electron Microscopy ...
    • Nanowire formation for single electron transistor using SEM based Electron Beam Lithography (EBL) technique: Positive tone vs negative tone e-beam resist 

      Mohammad Nuzaihan, Md Nor; Uda, Hashim; Nur Hamidah, Abdul Halim; Bajuri, S. N M (Nano Science and Technology Institute, 2006)
      Experimental studies of nanowires formation are carried out by using Scanning Electron Microscope Based Electron Beam Lithography (EBL) Technique with critical dimensions in less than 100nm. In order to complete the design ...
    • Reproducibility of silicon single electron quantum dot transistor 

      Uda, Hashim; Sutikno, Madnarski (Nano Science and Technology Institute, 2006)
      In principle, based on the form of tunnel junction, single electron transistor (SET) can be classified into four types, i.e. nanowire SET, quantum dot SET, nanotube SET and point contact SET. Another classification is SET ...
    • Design and fabrication of Microfluidic devices: MOSFET & Capacitor 

      Osman, R. A.; Esa, S. R.; Prabakaran, Poopalan (Institute of Electrical and Electronics Engineers (IEEE), 2006)
      Microfluidic devices, based on silicon, are fabricated by photolithography, wet chemical etching with focus on an liquid conduction channel n-channel depletion MOSFET and a silica-liquid dielectric capacitor. Masks for ...
    • The characterization of power supply noise for optical mouse sensor 

      Mohd Khairuddin, Md Arshad; Uda, Hashim; Ming, Choo Chew (Institute of Electrical and Electronics Engineering (IEEE), 2006)
      The induced power supply noise (sinusoidal waveform) that injected to Vdd pin will cause unwanted spike at the positive amplitude and negative amplitude to the DC input voltage. At certain limit this spike will cause the ...
    • Characterization of robust alignment mark to improve alignment performance 

      Normah, Ahmad; Uda, Hashim; Mohd Jefrey, Manaf; Kader, Ibrahim (Institute of Electrical and Electronics Engineering (IEEE), 2006)
      Overlay requirement is one of the biggest obstacles in achieving a very small feature. With the continued growth of small feature size, overlay requirement becomes tighter. Such a tight requirement requires a very high ...
    • Characteristics of Serial Peripheral Interfaces (SPI) timing parameters for optical mouse sensor 

      Mohd Khairuddin, Md Arshad; Uda, Hashim; Choo, C.M. (Institute of Electrical and Electronics Engineering (IEEE), 2006)
      In this paper we report the characterizations results of Serial Peripheral Interface (SPI) timing parameters for optical mouse sensor. SPI is an interface that facilitates the transfer of synchronous serial data. It supports ...
    • Face recognition using eigenfaces and neural networks 

      Mohamed Rizon; Muhammad Firdaus, Hashim; Puteh, Saad; Sazali, Yaacob, Prof. Dr.; Mohd Rozailan, Mamat; Ali Yeon, Md Shakaff, Prof. Dr.; Abdul Rahman, Saad; Hazri, Desa, Dr.; Karthigayan, M. (Science Publications, 2006)
      In this study, we develop a computational model to identify the face of an unknown person’s by applying eigenfaces. The eigenfaces has been applied to extract the basic face of the human face images. The eigenfaces is ...
    • Degradation of single layer MEH-PPV organic light emitting diode (OLED) 

      Nurjuliana, Juhari; Wan Haliza, Abd. Majid; Zainol Abidin, Ibrahim (Institute of Electrical and Electronics Engineering (IEEE), 2006)
      The degradation process of a single layer electroluminescence (EL) polymer MEH-PPV organic light emitting diode (OLED) with the MEH-PPV thickness of 57plusmn3 nm is discussed. Typical structure of OLED fabrication is ...
    • Design of 100nm single-electron transistor (SET) by 2D TCAD simulation 

      Amiza, Rasmi; Uda, Hashim; Awang Mat, Abd F (Institute of Electrical and Electronics Engineering (IEEE), 2006)
      One of the great problems in current large-scale integrated circuits (LSIs) is increasing power dissipation in a small silicon chip. Single-electron transistor (SET) which operate by means of one-by-one electron transfer, ...
    • Alignment mark architecture effect on alignment signal behavior in advanced lithography 

      Normah, Ahmad; Uda, Hashim; Mohd Jeffrey, Manaf; Kader Ibrahim, Abdul Wahab (Institute of Electrical and Electronics Engineering (IEEE), 2006)
      The downscaling of CMOS technology becomes a challenge to the scanner alignment system since overlay and alignment accuracy becomes tighter. Such a tight overlay requirement requires a very stable alignment performance. A ...
    • Surface state on first-order ferroelectrics 

      Junaidah, Osman; Tilley, David Reginald; Rosy, Teh; Ishibashi, Y.; Mohamad Nazri, Abdul Halif; Khian, Hooi Chew (Springer Berlin / Heidelberg, 2006)
      In the presence of a surface the Landau-Devonshire equations of ferroelectricity must be extended to include a boundary condition. For a ferroelectric with a second-order transition in the case when the polarization p(z) ...
    • Growth of GaN quantum dots using [(C2H5)4]Si by plasma assisted MOCVD 

      Arsyad, F. S.; Subagio, A.; Sutanto, H.; Arifin, P.; Budiman, M.; Barmawi, M.; Husien, I.; Zul Azhar, Zahid Jamal (Institute of Electrical and Electronics Engineering (IEEE), 2006-07)
      Growth of GaN quantum dots on AlGaN layer using [(C2H 5)4]Si [TESi] by plasma assisted metal organic chemical vapor deposition (PA-MOCVD) is reported. The surface profile of the grown GaN quantum dot was determined by ...
    • The effects of multiple zincation process on Aluminum Bond Pad surface for Electroless Nickel Immersion Gold deposition 

      Mohd Khairuddin, Md Arshad; Ibrahim, Ahmad; Azman, Jalar; Ghazali, Omar; Uda, Hashim (American Society of Mechanical Engineers (ASME), 2006-09)
      This paper reports the effects of a multiple zincation processon the Al bond pad surface prior to electroless nickel immersion gold deposition. The study of multiple zincation comprises the surface topogtaphy and morphology ...
    • Uninterruptible power supply monitoring system with Visual Basic 

      Sohiful Anuar, Zainol Murad; Mohd Nazrin, Md Isa; Norazeani, Abdul Rahman (Universiti Malaysia PerlisSchool of Microelectronic Engineering, 2006-12-29)
      In industrial process today, reliability of equipment is very important. Power supply must be able to cater the need of industrial process. In case of power failure, backup power supply system must be able to support the ...
    • FPGA based SPWM Bridge Inverter 

      Mohd Nazrin, Md Isa; Muhammad Imran, Ahmad; Sohiful Anuar, Zainol Murad; Mohd Khairuddin, Md Arshad (Science Publications, 2007)
      This study presents methodology to generate sinusoidal pulse width modulation (SPWM) signal using Field Programmable Gate Array, FPGA technology. We discussed the unipolar switching scheme and the methodology to generate ...