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dc.contributor.authorHaftirman, Idrus, Dr.
dc.contributor.authorAfendi, M.
dc.contributor.authorWong, Chun Hoe
dc.date.accessioned2014-05-08T07:58:27Z
dc.date.available2014-05-08T07:58:27Z
dc.date.issued2014
dc.identifier.citationKey Engineering Materials, vol.594-595, 2014, pages 1105-1111en_US
dc.identifier.issn1662-9795
dc.identifier.urihttp://dspace.unimap.edu.my:80/dspace/handle/123456789/34370
dc.descriptionLink to publisher's homepage at http://www.ttp.net/en_US
dc.description.abstractFatigue crack initiation and growth of aluminum alloys with stress ratio were investigated due to it was widely used in aircraft production parts. Various types of aluminium alloy have been selected (6063-T6, 7075-T6, and 2024-T351). Compact design standard based on ASTM standard E647-11 was used for specimen. Cyclic loading experiment was conducted using Instron 8801 Hydraulic Server Machine with da/dN software for setup and parameter setting. Investigations on crack propagation and fracture surface were done by using Scanning Electron Microscope (SEM) to obtain the image of the specimen surface. Further analysis was done on the image to study on the crack initiation and propagation. Various stress ratio effects were set for the compact specimens having thickness 12.7 mm. Relationship between crack growth rate and the stress intensity factor range were further identified with the stress ratio effects. The gradients of crack growth rate increase while the stress ratio, R increase. Higher R-ratio results in higher value range of minimum load applied. Paris law and Modified Forman law were used as comparison with the experimental data for validation purposes and to provide the level of precision.en_US
dc.language.isoenen_US
dc.publisherTrans Tech Publicationsen_US
dc.subjectAerospace vehiclesen_US
dc.subjectAluminum alloyen_US
dc.subjectFatigue Crack Growth (FCG)en_US
dc.subjectFracture mechanicsen_US
dc.titleFatigue crack initiation and growth of aluminum alloy with stress ratio effectsen_US
dc.typeArticleen_US
dc.identifier.urlhttp://www.scientific.net/KEM.594-595.1105
dc.identifier.doi10.4028/www.scientific.net/KEM.594-595.1105
dc.contributor.urlhaftirman@unimap.edu.myen_US
dc.contributor.urlafendi@unimap.edu.myen_US
dc.contributor.urlchun_hoe89@yahoo.comen_US


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