Browsing International Journal of Nanoelectronics and Materials (IJNeaM) by Subject "Design for testability"
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Built-In self-configurable architecture for memristor based memories
(Universiti Malaysia Perlis (UniMAP), 2019-10)Memristor is an attractive candidate to replace the present computation and storage devices due to its novel features namely nanoscale size, low power, non-volatility, high compatibility with CMOS, and multi-bit operations. ...