Browsing International Journal of Nanoelectronics and Materials (IJNeaM) by Subject "New refractometer"
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A New Technique for Measuring the Refractive Index
(Universiti Malaysia Perlis (UniMAP), 2018-10)Refractive index is an essential optical parameter of materials. The operating principle of the refractometer is already known for more than hundred years. Refractometer measurement principally consists of analyzing an ...