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dc.contributor.authorN. K., Hassan
dc.contributor.authorM. Roslan, Hashim
dc.contributor.authorYarub, Al - Douri
dc.date.accessioned2014-06-04T03:51:36Z
dc.date.available2014-06-04T03:51:36Z
dc.date.issued2014-06
dc.identifier.citationOptik - International Journal for Light and Electron Optics, vol.125 (1), 2014, pages 2560-2564en_US
dc.identifier.issn0030-4026
dc.identifier.urihttp://dspace.unimap.edu.my:80/dspace/handle/123456789/35048
dc.descriptionLink to publisher's homepage at http://www.elsevier.comen_US
dc.description.abstractZinc-oxide (ZnO) pyramidal and nanoflakes were grown by electrochemical deposition of Zn(NO3)2·6H2O on n-type Si substrate with different crystallographic orientations and on indium tin oxide (ITO)-coated glass. Various morphological shapes of deposited ZnO nanostructures were observed, which were investigated by scanning electron microscopy (SEM) and X-ray diffraction (XRD). The bulk modulus was calculated to determine the material stiffness. Two peaks were observed at room temperature photoluminescence spectrum, i.e., a near-band-edge (NBE) emission in the UV region and a broad deep-level emission (DLE) in the green emission region. The optical properties were calculated to confirm the specific models validity of ZnO nanostructures for optoelectronics. The measured and calculated values show good agreement with other data.en_US
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.subjectZnOen_US
dc.subjectCharacterizationen_US
dc.subjectOptical propertiesen_US
dc.titleMorphology and optical investigations of ZnO pyramids and nanoflakes for optoelectronic applicationsen_US
dc.typeArticleen_US
dc.identifier.urlhttp://www.sciencedirect.com/science/article/pii/S0030402613013648
dc.contributor.urlyaldouri@yahoo.comen_US


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