Characterization of parasitic residual deposition on passivation layer in electronics nickel immersion gold process

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Date

2007

Author

Mohd Khairuddin, Md Arshad

Azman, Jalar

Ibrahim, Ahmad

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http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6V47-4M1D0KK-1&_user=1659113&_coverDate=07%2F31%2F2007&_rdoc=1&_fmt=high&_orig=search&_origin=search&_sort=d&_docanchor=&view=c&_searchStrId=1553672756&_rerunOrigin=google&_acct=C000054070&_version=1&_urlVersion=0&_userid=1659113&md5=1fb77f161a6870e88296f8e356e66bb0&searchtype=a
http://www.elsevier.com/
http://dspace.unimap.edu.my/123456789/3503

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• School of Microelectronic Engineering (Articles) [183]