Total Visits

Views
Electrical characterization of 0.13 µm NMOS transistor with Retrograde Well and Halo Implant Structure Respectively112

Total Visits Per Month

September 2024October 2024November 2024December 2024January 2025February 2025March 2025
Electrical characterization of 0.13 µm NMOS transistor with Retrograde Well and Halo Implant Structure Respectively1027240

File Visits

Views
Introduction.pdf3
Conclusion.pdf2
Literature review.pdf2
References and appendix.pdf2
Results and discussion.pdf2
Abstract, Acknowledgment.pdf1
Methodology.pdf1

Top country views

Views
United States55
Malaysia12
Vietnam9
China6
Finland6
Argentina4
Belgium4
Germany4
Australia3
Japan2

Top cities views

Views
Hanoi9
Kuala Lumpur9
Boardman6
Des Moines5
San Mateo5
Andover3
Batu Tiga2
Los Angeles2
Ashburn1
Beijing1