Total Visits

Views
Electrical characterization of 0.13 µm NMOS transistor with Retrograde Well and Halo Implant Structure Respectively81

Total Visits Per Month

January 2024February 2024March 2024April 2024May 2024June 2024July 2024
Electrical characterization of 0.13 µm NMOS transistor with Retrograde Well and Halo Implant Structure Respectively41033113

File Visits

Views
Introduction.pdf2
Literature review.pdf2
Abstract, Acknowledgment.pdf1
Conclusion.pdf1
Methodology.pdf1
References and appendix.pdf1
Results and discussion.pdf1

Top country views

Views
United States33
Malaysia12
Vietnam9
Finland6
China5
Argentina4
Germany4
Australia2
Ireland1
India1

Top cities views

Views
Hanoi9
Kuala Lumpur9
Des Moines5
Boardman3
Batu Tiga2
Los Angeles2
Beijing1
Dublin1
Ernakulam1
Hangzhou1