Total Visits

Views
Electrical characterization of 0.13 µm NMOS transistor with Retrograde Well and Halo Implant Structure Respectively131

Total Visits Per Month

June 2025July 2025August 2025September 2025October 2025November 2025December 2025
Electrical characterization of 0.13 µm NMOS transistor with Retrograde Well and Halo Implant Structure Respectively0050232

File Visits

Views
Introduction.pdf5
Literature review.pdf5
Results and discussion.pdf5
Conclusion.pdf4
Methodology.pdf4
Abstract, Acknowledgment.pdf2
References and appendix.pdf2

Top country views

Views
United States58
Malaysia13
Vietnam10
China9
Finland6
Argentina5
Australia5
Belgium4
Germany4
Singapore4

Top cities views

Views
Kuala Lumpur10
Hanoi9
Boardman6
San Mateo6
Des Moines5
Andover3
Batu Tiga2
Los Angeles2
Perth2
Singapore2