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http://dspace.unimap.edu.my:80/xmlui/handle/123456789/33691
Title: | BaₓSr₁-ₓ TiO₃ different thickness analysis using sol gel approach |
Authors: | Nurhafizah, Ramli Zaliman, Sauli, Dr. Retnasamy, Vithyacharan They, Yee Chin Khairul Anwar, Mohamad Khazali Nooraihan, Abdullah zaliman@unimap.edu.my |
Keywords: | Barium Strontium Titanate (BST) Film thickness |
Issue Date: | Jan-2014 |
Publisher: | Trans Tech Publications |
Citation: | Applied Mechanics and Materials, vol.487, 2014, pages 29-32 |
Abstract: | Barium Strontium Titanate (BST) a common topic in the microelectronic field for many devices which is mainly on dynamic random access memories (DRAM). There are many methods of preparing BaₓSr₁-ₓTiO3; barium strontium titanate. In this work, sol-gel method was used as it has some advantages like better homogeneity, lower cost, lower processing temperature and easier fabrication. BaₓSr₁-ₓTiO3 solution was deposited on the silicon substrate of 4 different thicknesses with different ratio of the concentration of Barium (Ba). The thickness of the thin film has a linear increase as the Ba content increases. |
Description: | Link to publisher's homepage at http://www.ttp.net/ |
URI: | http://dspace.unimap.edu.my:80/dspace/handle/123456789/33691 |
ISSN: | 1662-7482 |
Appears in Collections: | Khairul Anwar Mohamad Khazali, Dr. Nooraihan Abdullah, Dr. Vithyacharan Retnasamy Zaliman Sauli, Lt. Kol. Professor Dr. Institute of Engineering Mathematics (Articles) School of Microelectronic Engineering (Articles) |
Files in This Item:
File | Description | Size | Format | |
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BaₓSr₁-ₓ TiO3 different thickness analysis using sol gel approach.pdf | 250.99 kB | Adobe PDF | View/Open |
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