Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/33691
Title: BaₓSr₁-ₓ TiO₃ different thickness analysis using sol gel approach
Authors: Nurhafizah, Ramli
Zaliman, Sauli, Dr.
Retnasamy, Vithyacharan
They, Yee Chin
Khairul Anwar, Mohamad Khazali
Nooraihan, Abdullah
zaliman@unimap.edu.my
Keywords: Barium Strontium Titanate (BST)
Film thickness
Issue Date: Jan-2014
Publisher: Trans Tech Publications
Citation: Applied Mechanics and Materials, vol.487, 2014, pages 29-32
Abstract: Barium Strontium Titanate (BST) a common topic in the microelectronic field for many devices which is mainly on dynamic random access memories (DRAM). There are many methods of preparing BaₓSr₁-ₓTiO3; barium strontium titanate. In this work, sol-gel method was used as it has some advantages like better homogeneity, lower cost, lower processing temperature and easier fabrication. BaₓSr₁-ₓTiO3 solution was deposited on the silicon substrate of 4 different thicknesses with different ratio of the concentration of Barium (Ba). The thickness of the thin film has a linear increase as the Ba content increases.
Description: Link to publisher's homepage at http://www.ttp.net/
URI: http://dspace.unimap.edu.my:80/dspace/handle/123456789/33691
ISSN: 1662-7482
Appears in Collections:Khairul Anwar Mohamad Khazali, Dr.
Nooraihan Abdullah, Dr.
Vithyacharan Retnasamy
Zaliman Sauli, Lt. Kol. Professor Dr.
Institute of Engineering Mathematics (Articles)
School of Microelectronic Engineering (Articles)

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