Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/23994
Title: RF behavior of undoped channel ultra-thin body with ultra-thin BOX MOSFETs
Authors: Mohd Khairuddin, Md Arshad, Dr.
Mostafa, Emam
Kilchytska, Valeria I., Dr.
Andrieu, François, Dr.
Flandre, Denis, Prof.
Raskin, Jean-Pierre P., Prof.
mohd.khairuddin@unimap.edu.my
mohd.mdarshad@uclouvain.be
jean-pierre.raskin@uclouvain.be
pascal.scheiblin@cea.fr
Keywords: Capacitance
Equivalent circuits
Logic gates
MOSFETs
Radio frequency
Substrates
Ultra-thin body with ultra-thin buried oxide (UTBB)
Parasitic capacitance
Issue Date: Jan-2012
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Citation: p.105-108
Series/Report no.: Proceeding of the IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF 2012)
Abstract: RF performance of ultra-thin body with ultra-thin buried oxide (BOX), so-called UTBB, MOSFETs with gate length down to 30 nm is presented. Current gain cut-off frequency f T and maximum oscillation frequency f max of 160 GHz and 143 GHz, respectively, are demonstrated. Based on an accurate extraction of the small-signal equivalent circuit of UTBB MOSFET over a wide frequency range, it is revealed that ground plane (GP) implementation (i.e. highly-doped region underneath the BOX)does not increase the high frequency parasitic capacitances, and thus does not degrade the RF performance of UTBB devices.
Description: Link to publisher's homepage at http://ieeexplore.ieee.org/
URI: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?reload=true&arnumber=6160155&contentType=Conference+Publications
http://dspace.unimap.edu.my/123456789/23994
ISBN: 978-145771316-3
Appears in Collections:Conference Papers

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