Algorithm to improve process robustness in the assembly & test manufacturing industry a case study of the 1064nm wavelength laser mark equipment

dc.contributor.author	Darin Moreira A/L Anthony Vincent
dc.contributor.author	Bhuvenesh, Prof. Dr. Rajamony
dc.date.accessioned	2013-10-08T11:34:23Z
dc.date.available	2013-10-08T11:34:23Z
dc.date.issued	2013-09
dc.identifier.citation	Applied Mechanics and Materials, vol. 421, 2013, pages 898-903	en_US
dc.identifier.issn	1662-7482
dc.identifier.uri	http://www.scientific.net/AMM.421.898
dc.identifier.uri	http://dspace.unimap.edu.my/123456789/28650
dc.description	Link to publisher's homepage at http://www.ttp.net/	en_US
dc.description.abstract	This document explains and demonstrates the generic improvement algorithm created to enhance the maintenance methodology in the semiconductor manufacturing environment. The use of this algorithm demonstrates how a process and equipment can utilize it and get better output quality from a process and cost standpoint, which is a key driver in any manufacturing industry.	en_US
dc.language.iso	en	en_US
dc.publisher	Trans Tech Publications	en_US
dc.subject	Manufacturing industry	en_US
dc.subject	Case study	en_US
dc.subject	IR laser	en_US
dc.subject	Laser mark	en_US
dc.subject	Maintenance algorithm	en_US
dc.subject	Quality output	en_US
dc.subject	TRIZ	en_US
dc.title	Algorithm to improve process robustness in the assembly & test manufacturing industry a case study of the 1064nm wavelength laser mark equipment	en_US
dc.type	Article	en_US
dc.contributor.url	bhuvenesh@unimap.edu.my	en_US