Total Visits

Views
Electrical characterization of 0.13 µm NMOS transistor with Retrograde Well and Halo Implant Structure Respectively99

Total Visits Per Month

May 2024June 2024July 2024August 2024September 2024October 2024November 2024
Electrical characterization of 0.13 µm NMOS transistor with Retrograde Well and Halo Implant Structure Respectively311414102

File Visits

Views
Introduction.pdf3
Conclusion.pdf2
Literature review.pdf2
References and appendix.pdf2
Abstract, Acknowledgment.pdf1
Methodology.pdf1
Results and discussion.pdf1

Top country views

Views
United States45
Malaysia12
Vietnam9
Finland6
China5
Argentina4
Belgium4
Germany4
Australia2
Japan2

Top cities views

Views
Hanoi9
Kuala Lumpur9
Boardman6
Des Moines5
Batu Tiga2
Los Angeles2
Ashburn1
Beijing1
Dublin1
Ernakulam1