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Total Visits
| Views | |
|---|---|
| Analysis of the deposited carbon during Electron Beam Induced Deposition (EBID) in Scanning Electron Microscope using Secondary Ion Mass Spectrometry (SIMS) | 128 |
Total Visits Per Month
| September 2024 | October 2024 | November 2024 | December 2024 | January 2025 | February 2025 | March 2025 | |
|---|---|---|---|---|---|---|---|
| Analysis of the deposited carbon during Electron Beam Induced Deposition (EBID) in Scanning Electron Microscope using Secondary Ion Mass Spectrometry (SIMS) | 4 | 11 | 2 | 8 | 7 | 0 | 1 |
File Visits
| Views | |
|---|---|
| Abstract, Acknowledgment.pdf | 4 |
| Results and discussion.pdf | 4 |
| Methodology.pdf | 3 |
| References and appendix.pdf | 3 |
| Conclusion.pdf | 2 |
| Literature review.pdf | 2 |
| Introduction.pdf | 1 |
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