Statistics
Total Visits
| Views | |
|---|---|
| Gate Oxide Integrity (GOI) Characterization For Deep Submicron CMOS Device | 230 |
Total Visits Per Month
| January 2024 | February 2024 | March 2024 | April 2024 | May 2024 | June 2024 | July 2024 | |
|---|---|---|---|---|---|---|---|
| Gate Oxide Integrity (GOI) Characterization For Deep Submicron CMOS Device | 7 | 2 | 4 | 6 | 2 | 12 | 3 |
File Visits
| Views | |
|---|---|
| Abstract, Acknowledgment.pdf | 243 |
| Literature review.pdf | 5 |
| Results and discussion.pdf | 2 |
| Conclusion.pdf | 1 |
| Introduction.pdf | 1 |
| Methodology.pdf | 1 |
| References and appendix.pdf | 1 |
Top country views
| Views | |
|---|---|
| China | 61 |
| United States | 55 |
| Taiwan | 23 |
| Malaysia | 14 |
| Germany | 10 |
| Vietnam | 9 |
| Finland | 7 |
| India | 6 |
| Japan | 6 |
| Singapore | 6 |
Top cities views
| Views | |
|---|---|
| Taipei | 11 |
| Beijing | 10 |
| Hanoi | 9 |
| Hangzhou | 8 |
| Shanghai | 8 |
| Semenyih | 7 |
| Boardman | 5 |
| Des Moines | 5 |
| Tsuen Wan | 5 |
| Budapest | 4 |