Now showing items 45-50 of 50

    • Techniques in Integrated Circuit (IC) failure analysis 

      Zul Azhar, Zahid Jamal, Assoc. Prof. Dr.; Sanna, Taking (ELectron Microscopy Society of Malaysia (EMSM), 2004-12-13)
      Failure analysis (FA) plays an important role in the development and manufacturing of integrated circuits. It provides necessary information for technology advancement and for corrective action to improve quality ...
    • Temperature cycling analysis for ball grid array package using finite element analysis 

      Muhammad Nubli, Zulkifli; Zul Azhar, Zahid Jamal, Prof. Dr.; Ghulam, Abdul Quadir (Emerald Group Publishing Limited, 2011)
      Purpose – The purpose of this paper is to discuss the capability of finite element analysis (FEA) in performing the virtual thermal cycling reliability test to evaluate the reliability of solder joints in a ball grid array ...
    • An Undergraduate Micro Fabrication Course at the Northern Malaysia University College of Engineering 

      Uda, Hashim, Prof. Dr.; Zul Azhar, Zahid Jamal, Prof. Dr. (Kolej Universiti Kejuruteraan Utara Malaysia, 2004)
      This paper presents the development of a new course conducted by the School of Microelectronic Engineering at the Northern Malaysia University College of Engineering or Kolej Universiti Kejuruteraan Utara Malaysia (KUKUM) ...
    • Understanding the small world: an insight into the application of transmission electron microscopy in characterizing epitaxial layers 

      Zul Azhar, Zahid Jamal, Prof. Dr. (Penerbit Universiti Malaysia PerlisSchool of Microelectronic Engineering, 2010-04)
      Transmission electron microscopy (TEM) is an unrivalled technique for observing, characterizing and analyzing almost any type of materials. In physical science, the first observations of defects (i.e. dislocations) by TEM ...
    • Understanding the small world: an insight into the application of transmission electron microscopy in characterizing epitaxial layers 

      Zul Azhar, Zahid Jamal, Prof. Dr. (Penerbit Universiti Malaysia PerlisSchool of Microelectronic Engineering, 2010-04)
      Transmission electron microscopy (TEM) is an unrivalled technique for observing, characterizing and analyzing almost any type of materials. In physical science, the first observations of defects (i.e. dislocations) by TEM ...
    • UniMAP Lightweight Brick (ULB) 

      Khairul Nizar, Ismail, Dr.; Kamarudin, Hussin, Kol. Prof. Dato' Dr.; Saiful Azhar Saad; Wan Mohd Sabki, Wan Omar; Mokhzani Khair, Ishak; Libren Francis Doublin; Mohd. Shairil Amir (School of Environmental Engineering, 2008-01-09)
      UniMAP Lightweight Brick is made from cement, fine aggregate & waste. This project presents an experimental study which investigates the potential use of wastes for producing a low-cost and lightweight composite as a ...