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dc.contributor.authorUda, Hashim
dc.contributor.authorSutikno, Madnarski
dc.date.accessioned2009-08-14T02:10:50Z
dc.date.available2009-08-14T02:10:50Z
dc.date.issued2006
dc.identifier.citationTechnical Proceedings 3, p.35-38en_US
dc.identifier.urihttp://www.nsti.org/Nanotech2006/
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/6893
dc.descriptionLink to publisher's homepage at http://www.nsti.org/Nanotech2006/en_US
dc.description.abstractIn principle, based on the form of tunnel junction, single electron transistor (SET) can be classified into four types, i.e. nanowire SET, quantum dot SET, nanotube SET and point contact SET. Another classification is SET based on the kind of conducting material between gate and island, which consists of resistive-SET and capacitive SET. There are about 18 types of SET designs have previously published by many researchers. This paper describes each SET design of 18 all in the reproducibly design point of view at most the form of source-drain contact junction, layers structure, and the modification of fabrication technology. The reproducibility of single electron transistor can be observed from the equity of design, dimension and device characteristics. Indeed, the forms of SET source-drain contact junction have very large influences on the difficulties level of fabrication processes and electrical characteristics.en_US
dc.language.isoenen_US
dc.publisherNano Science and Technology Instituteen_US
dc.relation.ispartofseriesTechnical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006en_US
dc.subjectCoulomb blockade oscillationen_US
dc.subjectDesign of SETen_US
dc.subjectQuantum doten_US
dc.subjectReproducibilityen_US
dc.subjectSingle electron transistoren_US
dc.subjectTransistorsen_US
dc.subjectTransistors -- Design and constructionen_US
dc.titleReproducibility of silicon single electron quantum dot transistoren_US
dc.typeArticleen_US


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