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dc.contributor.authorArsyad, F. S.
dc.contributor.authorSubagio, A.
dc.contributor.authorSutanto, H.
dc.contributor.authorArifin, P.
dc.contributor.authorBudiman, M.
dc.contributor.authorBarmawi, M.
dc.contributor.authorHusien, I.
dc.contributor.authorZul Azhar, Zahid Jamal
dc.date.accessioned2009-08-07T02:00:14Z
dc.date.available2009-08-07T02:00:14Z
dc.date.issued2006-07
dc.identifier.citationp.116-118en_US
dc.identifier.isbn1-4244-0452-5
dc.identifier.urihttp://ieeexplore.ieee.org/xpls/abs_all.jsp?=&arnumber=4143344
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/6698
dc.descriptionLink to publisher's homepage at http://ieeexplore.ieee.orgen_US
dc.description.abstractGrowth of GaN quantum dots on AlGaN layer using [(C2H 5)4]Si [TESi] by plasma assisted metal organic chemical vapor deposition (PA-MOCVD) is reported. The surface profile of the grown GaN quantum dot was determined by atomic force microscope (AFM). The typical average density of the dots is around 4 × 109 cm-2, while the diameter and the height of the dots are approximately 100 and 50 nm, respectively. The density and the size of the dots significantly depend on the dose of TESi. It is found that the growth mode was changed from the two-dimensional step-flow to the three-dimensional island formation by modifying the AlGaN surface energy induced by the deposited Si.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineering (IEEE)en_US
dc.relation.ispartofseriesProceedings of the 2006 International Conference on Nanoscience and Nanotechnology (ICONN 2006)en_US
dc.subjectAluminium compoundsen_US
dc.subjectAtomic force microscopyen_US
dc.subjectSemiconductor quantum dotsen_US
dc.subjectSiliconen_US
dc.subjectWide band gap semiconductorsen_US
dc.subjectPA-MOCVDen_US
dc.subjectGaN Quantum Doten_US
dc.subject[(C2H5)4]Sien_US
dc.subjectDepositionen_US
dc.titleGrowth of GaN quantum dots using [(C2H5)4]Si by plasma assisted MOCVDen_US
dc.typeArticleen_US


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