| dc.contributor.author | Hosseini, Ehsan. | |
| dc.date.accessioned | 2016-04-22T10:53:30Z | |
| dc.date.available | 2016-04-22T10:53:30Z | |
| dc.date.issued | 2015 | |
| dc.identifier.citation | International Journal of Nanoelectronics and Materials, vol.8, 2015, pages 91-98 | en_US |
| dc.identifier.issn | 1985-5761 (Printed) | |
| dc.identifier.issn | 1997-4434 (Online) | |
| dc.identifier.uri | http://dspace.unimap.edu.my:80/xmlui/handle/123456789/41337 | |
| dc.description | Link to publisher's homepage at http://ijneam.unimap.edu.my/ | en_US |
| dc.description.abstract | This research examines the ingredients of Cobalt-60 propagation on the electrical attributes of single-walled carbon nanotube and (G-FETs). The research observes significant variances in the radiation response of instruments depending on their propagation environment, and corroborate under controlled conditions, standard dielectric hardening approaches are useable to carbon nanoelectronics devices. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Universiti Malaysia Perlis | en_US |
| dc.subject | Radiation | en_US |
| dc.subject | Mobility | en_US |
| dc.subject | Field effect transistors (FETs) | en_US |
| dc.title | Propagation effects in carbon nanoelectronics | en_US |
| dc.type | Article | en_US |
| dc.contributor.url | _Hosseiny.e@gmail.com. | en_US |
