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dc.contributor.authorYasmin, Abdul Wahab
dc.contributor.authorRuzairi, Abdul Rahim, Prof. Dr.
dc.contributor.authorMohd Hafiz, Fazalul Rahiman, Dr.
dc.contributor.authorHerlina, Abdul Rahim, Dr.
dc.contributor.authorSuzanna, Ridhuan Aw
dc.contributor.authorJuliza, Jamaludin
dc.contributor.authorNaizatul Shima, Mohd Fadzil
dc.date.accessioned2015-05-25T01:58:06Z
dc.date.available2015-05-25T01:58:06Z
dc.date.issued2014
dc.identifier.citationJurnal Teknologi, vol.70(3), 2014, pages 35-39en_US
dc.identifier.issn0127-9696 (P)
dc.identifier.issn2180-3722 (O)
dc.identifier.urihttp://www.jurnalteknologi.utm.my/index.php/jurnalteknologi/article/view/3459
dc.identifier.urihttp://dspace.unimap.edu.my:80/xmlui/handle/123456789/39947
dc.descriptionLink to publisher's homepage at http://www.penerbit.utm.my/en_US
dc.description.abstractThe inspection system is crucial to ensure the system is always in a good condition. A technique that can be used for inspection system is process tomography. By promising non-destructive approach; various types of process tomography applied in civil, manufacturing and electrical applications. The purpose of this paper is to review the types of process tomography such as ultrasonic tomography, x-ray tomography, optical tomography, electrical resistance tomography, and electrical impedance tomography that had been applied to the inspection system. Variety techniques of inspection based on those sensors briefly discussed in this paper. The result showed that the process tomography expanded tremendously in the inspection system. Finally, a potential future research on the inspection system in the civil application proposed in this paper.en_US
dc.language.isoenen_US
dc.publisherPenerbit UTM Pressen_US
dc.subjectElectrical impedance tomographyen_US
dc.subjectElectrical resistance tomographyen_US
dc.subjectInspection systemen_US
dc.subjectOptical tomographyen_US
dc.subjectProcess tomographyen_US
dc.subjectUltrasonic tomographyen_US
dc.subjectX-ray tomographyen_US
dc.titleA review of process tomography application in inspection systemen_US
dc.typeArticleen_US
dc.contributor.urlyasmin@ump.edu.myen_US
dc.contributor.urlruzairi@fke.utm.myen_US
dc.contributor.urlhafiz@unimap.edu.myen_US
dc.contributor.urlherlina@fke.utm.myen_US


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