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Drain-induced barrier lowering (DIBL) (1) |
fully depleted silicon-on-insulator (FDSOI) MOSFETs (1) |
MASTAR model (1) |
Substrate depletion depth (T Sub) (1) |
Substrate/buried oxide (BOX) interface space-charge condition (1) |
Ultrathin silicon body (UTB) (1) |
ultrathin silicon body and thin buried oxide (UTBB) (1) |