Browsing International Journal of Nanoelectronics and Materials (IJNeaM) by Subject "Capacitance–Voltage (C-V)"
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Experimental performance analysis of fabricated Si/Ge thin film structure
(Universiti Malaysia Perlis (UniMAP), 2023-01)This paper is devoted to the evaluation of a Silicon/Germanium (Si/Ge) thin film structure based on experimental measurements. An electron beam evaporator was used to fabricate this structure. The sample was prepared ...