Browsing International Journal of Nanoelectronics and Materials (IJNeaM) by Author "See, J. H."
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ESD improvement in P-i-N diode through introducing a lighter and deeper anode junction
See, J. H.; Md Arshad, M. K.; Fathil, M. F. M. (Universiti Malaysia Perlis (UniMAP), 2017)Continuous and aggressive miniaturization in the electronic gadget size poses a challenge in solving Electrostatic Discharge (ESD) reliability performance. For diode devices, the shrinkage of the size leads to severe ...