Total Visits

Views
Study of the thickness of the Silicon Dioxide on wafer using Dry and Wet Oxidation method115

Total Visits Per Month

July 2024August 2024September 2024October 2024November 2024December 2024January 2025
Study of the thickness of the Silicon Dioxide on wafer using Dry and Wet Oxidation method118513311

File Visits

Views
Introduction.pdf3
Conclusion.pdf2
Literature review.pdf2
Abstract, Acknowledgment.pdf2
References and appendix.pdf2
Results and discussion.pdf2
Methodology.pdf1

Top country views

Views
United States53
China16
Vietnam9
Belgium8
Germany6
Finland6
Malaysia4
Singapore4
Australia2
Indonesia1

Top cities views

Views
San Mateo10
Hanoi9
Boardman6
Des Moines4
Ipoh2
Shanghai2
Amsterdam1
Andover1
Canberra1
Dublin1