Statistics
Total Visits
| Views | |
|---|---|
| Analysis of the deposited carbon during Electron Beam Induced Deposition (EBID) in Scanning Electron Microscope using Secondary Ion Mass Spectrometry (SIMS) | 163 |
Total Visits Per Month
| June 2025 | July 2025 | August 2025 | September 2025 | October 2025 | November 2025 | December 2025 | |
|---|---|---|---|---|---|---|---|
| Analysis of the deposited carbon during Electron Beam Induced Deposition (EBID) in Scanning Electron Microscope using Secondary Ion Mass Spectrometry (SIMS) | 2 | 4 | 6 | 5 | 3 | 9 | 2 |
File Visits
| Views | |
|---|---|
| Abstract, Acknowledgment.pdf | 6 |
| Literature review.pdf | 6 |
| Results and discussion.pdf | 6 |
| Introduction.pdf | 5 |
| References and appendix.pdf | 5 |
| Conclusion.pdf | 3 |
| Methodology.pdf | 3 |
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