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Total Visits
| Views | |
|---|---|
| Analysis of the deposited carbon during Electron Beam Induced Deposition (EBID) in Scanning Electron Microscope using Secondary Ion Mass Spectrometry (SIMS) | 112 |
Total Visits Per Month
| May 2024 | June 2024 | July 2024 | August 2024 | September 2024 | October 2024 | November 2024 | |
|---|---|---|---|---|---|---|---|
| Analysis of the deposited carbon during Electron Beam Induced Deposition (EBID) in Scanning Electron Microscope using Secondary Ion Mass Spectrometry (SIMS) | 4 | 4 | 4 | 13 | 4 | 11 | 2 |
File Visits
| Views | |
|---|---|
| Results and discussion.pdf | 3 |
| Abstract, Acknowledgment.pdf | 2 |
| Conclusion.pdf | 2 |
| Literature review.pdf | 2 |
| Methodology.pdf | 2 |
| References and appendix.pdf | 2 |
| Introduction.pdf | 1 |
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