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    A systematic dry etching process for profile control of quantum dots and nanoconstrictions 

    Madnarski, Sutikno; Uda, Hashim; Zul Azhar, Zahid Jamal (Elsevier B.V., 2007-08)
    In essence, quantum dot dimensions and others can be laterally and vertically defined by using either bottom up or top down methods respectively. In fabrication that uses top down method, etch process hold a chief role. ...
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    Silicon Nanowires 

    Uda, Hashim, Prof. Dr.; Mohammad Nuzaihan, Md Nor; Nur Hamidah, Abdul Halim (AFAG Messen & Ausstellungen GmbH, 2007-11-01)
    Silicon Nanowires with diameter or width of the order of a nanometer or 10o meter and length of the order of microns propel for a novel research in the construction of atomically controlled periodic systems with reduced ...

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    AuthorMadnarski, Sutikno (1)Mohammad Nuzaihan, Md Nor (1)Nur Hamidah, Abdul Halim (1)Uda, Hashim (1)Uda, Hashim, Prof. Dr. (1)... View MoreSubject
    Nanotechnology (2)
    Dry etch process (1)IENA 2007 (1)International Trade for Ideas - Inventions - New Products Exhibition 2007 (1)Nanostructure dimension (1)... View MoreDate Issued
    2007 (2)

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