Browsing Uda Hashim, Prof. Ts. Dr. by Subject "X-ray diffraction"
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CdS film thickness characterization by R.F. magnetron sputtering
(American Institute of Physics, 2009-06-01)In this work, cadmium sulphide (CdS) target with 99.999% purity was used as a target in RF magnetron sputtering. The sputtering experiment was conducted onto silicon oxide substrates at different temperatures ranging from ...