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    • A study for optimum productivity yield in 0.16μm mixed of wafer fabrication facility 

      Mohd Azizi, Chik; Ve, Chun Yung; Balakrishna, Puvaneswaran; Uda, Hashim, Prof. Dr.; Ibrahim, Ahmad; Bashir, Mohamad (Institute of Electrical and Electronics Engineers (IEEE), 2010-06-28)
      This research is to study the opportunity to achieve optimum productivity yield in 0.16μm product mixed through understanding the impact of loading utilization towards the capacity. The study is important to model the ...