Browsing The Library by Subject "X-ray diffraction"

Now showing items 1-2 of 2

    • CdS film thickness characterization by R.F. magnetron sputtering 

      Uda, Hashim, Prof. Dr.; Kasim, Abdul Rahman; Hakim; Mohd Azri, Othman (American Institute of Physics, 2009-06-01)
      In this work, cadmium sulphide (CdS) target with 99.999% purity was used as a target in RF magnetron sputtering. The sputtering experiment was conducted onto silicon oxide substrates at different temperatures ranging from ...

    • The effect of stoichiometry to the dielectric properties of barium titanate 

      Meor A. Faris; Yeoh, Cheow Keat, Dr.; W.M. Arif; Teh, Pei Leng, Dr. (Universiti Malaysia Perlis (UniMAP), 2012-06-18)
      Due to the high dielectric constant, barium titanate (BT) has many potential applications in electronic industry. This paper focuses on the effect of different ratio between barium (Ba) and titanium (Ti) to the production ...