Now showing items 41-47 of 47

    • Synthesis of finite length multi level sequences for clutter rejection in radar 

      Siti Julia, Rosli; Farid, Ghani, Prof. Dr.; Alif Hasmani, Abd Ghani; R. Badlishah, Ahmad, Prof. Dr. (Institute of Electrical and Electronics Engineers (IEEE), 2012-07-24)
      In radar systems the very low side-lobes that can be achieved with amplitude and phase modulated pulse trains make their use particularly attractive in systems requiring a large dynamic range. Moreover, the excellent ...
    • A systematic dry etching process for profile control of quantum dots and nanoconstrictions 

      Madnarski, Sutikno; Uda, Hashim; Zul Azhar, Zahid Jamal (Elsevier B.V., 2007-08)
      In essence, quantum dot dimensions and others can be laterally and vertically defined by using either bottom up or top down methods respectively. In fabrication that uses top down method, etch process hold a chief role. ...
    • Techniques in Integrated Circuit (IC) failure analysis 

      Zul Azhar, Zahid Jamal, Assoc. Prof. Dr.; Sanna, Taking (ELectron Microscopy Society of Malaysia (EMSM), 2004-12-13)
      Failure analysis (FA) plays an important role in the development and manufacturing of integrated circuits. It provides necessary information for technology advancement and for corrective action to improve quality ...
    • Temperature cycling analysis for ball grid array package using finite element analysis 

      Muhammad Nubli, Zulkifli; Zul Azhar, Zahid Jamal, Prof. Dr.; Ghulam, Abdul Quadir (Emerald Group Publishing Limited, 2011)
      Purpose – The purpose of this paper is to discuss the capability of finite element analysis (FEA) in performing the virtual thermal cycling reliability test to evaluate the reliability of solder joints in a ball grid array ...
    • Understanding the small world: an insight into the application of transmission electron microscopy in characterizing epitaxial layers 

      Zul Azhar, Zahid Jamal, Prof. Dr. (Penerbit Universiti Malaysia PerlisSchool of Microelectronic Engineering, 2010-04)
      Transmission electron microscopy (TEM) is an unrivalled technique for observing, characterizing and analyzing almost any type of materials. In physical science, the first observations of defects (i.e. dislocations) by TEM ...
    • Understanding the small world: an insight into the application of transmission electron microscopy in characterizing epitaxial layers 

      Zul Azhar, Zahid Jamal, Prof. Dr. (Penerbit Universiti Malaysia PerlisSchool of Microelectronic Engineering, 2010-04)
      Transmission electron microscopy (TEM) is an unrivalled technique for observing, characterizing and analyzing almost any type of materials. In physical science, the first observations of defects (i.e. dislocations) by TEM ...
    • UniMAP Lightweight Brick (ULB) 

      Khairul Nizar, Ismail, Dr.; Kamarudin, Hussin, Kol. Prof. Dato' Dr.; Saiful Azhar Saad; Wan Mohd Sabki, Wan Omar; Mokhzani Khair, Ishak; Libren Francis Doublin; Mohd. Shairil Amir (School of Environmental Engineering, 2008-01-09)
      UniMAP Lightweight Brick is made from cement, fine aggregate & waste. This project presents an experimental study which investigates the potential use of wastes for producing a low-cost and lightweight composite as a ...