Browsing Journal Articles by Subject "Reverse leakage current (IR) and Breakdown voltage (VBR)"
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ESD improvement in P-i-N diode through introducing a lighter and deeper anode junction
(Universiti Malaysia Perlis (UniMAP), 2017)Continuous and aggressive miniaturization in the electronic gadget size poses a challenge in solving Electrostatic Discharge (ESD) reliability performance. For diode devices, the shrinkage of the size leads to severe ...