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Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/6683
Title: Degradation of single layer MEH-PPV organic light emitting diode (OLED)
Authors: Nurjuliana, Juhari
Wan Haliza, Abd. Majid
Zainol Abidin, Ibrahim
Keywords: Electroluminescences
Scanning electron microscopy (SEM)
Organic light emitting diodes
Light emitting diodes
Semiconductors
Issue Date: 2006
Publisher: Institute of Electrical and Electronics Engineering (IEEE)
Citation: p.112-115
Series/Report no.: Proceedings of IEEE International Conference on Semiconductor Electronics (ICSE 2006)
Abstract: The degradation process of a single layer electroluminescence (EL) polymer MEH-PPV organic light emitting diode (OLED) with the MEH-PPV thickness of 57plusmn3 nm is discussed. Typical structure of OLED fabrication is Al/MEH-PPV/ITO (indium tin oxide). Electroluminescence (EL) spectrum indicates that the emission of MEH-PPV device is the yellow orange color. The device degrades by days as demonstrated by the increased in the turn on voltage obtained from I/V curves. The scanning electron microscope (SEM) images show some bubbles emerge on the surface of the device after an electric field was applied to it.
Description: Link to publisher's homepage at http://ieeexplore.ieee.org
URI: http://ieeexplore.ieee.org/xpls/abs_all.jsp?=&arnumber=4266580
http://dspace.unimap.edu.my/123456789/6683
ISSN: 4266580
Appears in Collections:School of Microelectronic Engineering (Articles)

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