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dc.contributor.authorNurjuliana, Juhari-
dc.contributor.authorWan Haliza, Abd. Majid-
dc.contributor.authorZainol Abidin, Ibrahim-
dc.date.accessioned2009-08-06T10:09:18Z-
dc.date.available2009-08-06T10:09:18Z-
dc.date.issued2006-
dc.identifier.citationp.112-115en_US
dc.identifier.issn4266580-
dc.identifier.urihttp://ieeexplore.ieee.org/xpls/abs_all.jsp?=&arnumber=4266580-
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/6683-
dc.descriptionLink to publisher's homepage at http://ieeexplore.ieee.orgen_US
dc.description.abstractThe degradation process of a single layer electroluminescence (EL) polymer MEH-PPV organic light emitting diode (OLED) with the MEH-PPV thickness of 57plusmn3 nm is discussed. Typical structure of OLED fabrication is Al/MEH-PPV/ITO (indium tin oxide). Electroluminescence (EL) spectrum indicates that the emission of MEH-PPV device is the yellow orange color. The device degrades by days as demonstrated by the increased in the turn on voltage obtained from I/V curves. The scanning electron microscope (SEM) images show some bubbles emerge on the surface of the device after an electric field was applied to it.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineering (IEEE)en_US
dc.relation.ispartofseriesProceedings of IEEE International Conference on Semiconductor Electronics (ICSE 2006)en_US
dc.subjectElectroluminescencesen_US
dc.subjectScanning electron microscopy (SEM)en_US
dc.subjectOrganic light emitting diodesen_US
dc.subjectLight emitting diodesen_US
dc.subjectSemiconductorsen_US
dc.titleDegradation of single layer MEH-PPV organic light emitting diode (OLED)en_US
dc.typeArticleen_US
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