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http://dspace.unimap.edu.my:80/xmlui/handle/123456789/6683
Title: | Degradation of single layer MEH-PPV organic light emitting diode (OLED) |
Authors: | Nurjuliana, Juhari Wan Haliza, Abd. Majid Zainol Abidin, Ibrahim |
Keywords: | Electroluminescences Scanning electron microscopy (SEM) Organic light emitting diodes Light emitting diodes Semiconductors |
Issue Date: | 2006 |
Publisher: | Institute of Electrical and Electronics Engineering (IEEE) |
Citation: | p.112-115 |
Series/Report no.: | Proceedings of IEEE International Conference on Semiconductor Electronics (ICSE 2006) |
Abstract: | The degradation process of a single layer electroluminescence (EL) polymer MEH-PPV organic light emitting diode (OLED) with the MEH-PPV thickness of 57plusmn3 nm is discussed. Typical structure of OLED fabrication is Al/MEH-PPV/ITO (indium tin oxide). Electroluminescence (EL) spectrum indicates that the emission of MEH-PPV device is the yellow orange color. The device degrades by days as demonstrated by the increased in the turn on voltage obtained from I/V curves. The scanning electron microscope (SEM) images show some bubbles emerge on the surface of the device after an electric field was applied to it. |
Description: | Link to publisher's homepage at http://ieeexplore.ieee.org |
URI: | http://ieeexplore.ieee.org/xpls/abs_all.jsp?=&arnumber=4266580 http://dspace.unimap.edu.my/123456789/6683 |
ISSN: | 4266580 |
Appears in Collections: | School of Microelectronic Engineering (Articles) |
Files in This Item:
File | Description | Size | Format | |
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Abstract.pdf | 7.97 kB | Adobe PDF | View/Open |
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