Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/58783
Title: The Influence of Nitrogen Pressure on the Structure of a-CNx Thin Films Prepared by PLD Method
Authors: Kamal, Kayed
khmk2000@gmail.com
Keywords: XPS Spectroscopy
Carbon Nitride
Raman Spectroscopy
Laser
Deposition
Issue Date: Jan-2019
Publisher: Universiti Malaysia Perlis (UniMAP)
Citation: International Journal of Nanoelectronics and Materials, vol.12(1), 2019, pages 19-24
Abstract: The structure of amorphous CNX thin films have a variety of chemical bond, and studies on these bonds ratios is very important because these ratios determine the appropriate technical use of these films. Therefore, this paper aim to investigate the relation between the conditions of preparation (deposition pressure) of a-CNx thin films prepared using PLD (Pulsed Laser Deposition) method and the film's structure. Results shown that the deposition pressure variation does not affecting the concentration in the same manner for all bonds in the film. Moreover, the sp2 cluster size and the order degree are related to the numerical value of the deposition pressure.
Description: Link to publisher's homepage at http://ijneam.unimap.edu.my
URI: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/58783
ISSN: 1985-5761 (Printed)
1997-4434 (Online)
Appears in Collections:International Journal of Nanoelectronics and Materials (IJNeaM)

Files in This Item:
File Description SizeFormat 
The Influence of Nitrogen Pressure on the Structure of a-CNx Thin.pdf770.42 kBAdobe PDFView/Open


Items in UniMAP Library Digital Repository are protected by copyright, with all rights reserved, unless otherwise indicated.