Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/40982
Title: Reducing cycle time in semiconductor manufacturing process
Authors: Lim Yee, Chew
Dr Muhammad Iqbal Muhammad Hussain
Keywords: Cycle time
Semiconductor -- Manufacturing process
Production cycle time
Cycle time improvement
Issue Date: Apr-2010
Publisher: Universiti Malaysia Perlis (UniMAP)
Abstract: This study concerns the Test Probes a semiconductor manufacturing process improvement. It is learned through the process flow and by collecting the required process time of the production line, then determined the causes and effects of running long production cycle times which widely vary and the cumulative impact on operating results are nearly incalculable. Identifying and correcting the root cause impediments are needed to be done in order to achieve significant improvements in production performance. So that the non-value added activities or time should be found by using the Lean Elements. Therefore, a lean technique, 5 S is used to reduce the processes cycle-time and increase the productivity in production line. 5 S is a combination of 5 items which are Sort, Sort in order, Shine, Standardizing and Self-discipline.
Description: Access is limited to UniMAP community.
URI: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/40982
Appears in Collections:School of Manufacturing Engineering (FYP)

Files in This Item:
File Description SizeFormat 
Abstract,Acknowledgement.pdf224.15 kBAdobe PDFView/Open
Introduction.pdf381.12 kBAdobe PDFView/Open
Literature Review.pdf226.73 kBAdobe PDFView/Open
Methodology.pdf131.29 kBAdobe PDFView/Open
Results and Discussion.pdf330.77 kBAdobe PDFView/Open
Conclusion and Recommendation.pdf68.14 kBAdobe PDFView/Open
Reference and Appendix.pdf204.21 kBAdobe PDFView/Open


Items in UniMAP Library Digital Repository are protected by copyright, with all rights reserved, unless otherwise indicated.