Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/35387
Title: Shear speed analysis on Sn-3.9Ag-0.6Cu Solder
Authors: Zaliman, Sauli, Dr.
Retnasamy, Vithyacharan
Fairul Afzal, Ahmad Fuad
Ehkan, Phaklen, Dr.
Ong, Tee Say
Vairavan, Rajendaran
zaliman@unimap.edu.my
vc.sundress@gmail.com
fairul@unimap.edu.my
phaklen@unimap.edu.my
Keywords: Ansys
Ball grid array (BGA)
Shear speed
Stress
Issue Date: 2013
Publisher: Trans Tech Publications (TTP)
Citation: Applied Mechanics and Materials, vol. 404, 2013, pages 72-76
Abstract: Ball Grid Array (BGA) is a type of semiconductor interconnection used in Integrated Circuit (IC) which is being scaled down to micro and nano size. The reliability of BGA in IC becomes a concern as the size of IC reduces. Hence, this leads to the study of stress on the BGA. This paper discussed the load effects of varying shear speed analysis on the BGA. A Pb-free material, Sn-3.9Ag-0.6Cu solder was applied in the simulation. Shear height value is fixed while the shear speed is varied to investigate the dynamic stress on a BGA package using Ansys software. The results from the graph plotted showed that higher shear speed results to higher shear force.
Description: Link to publisher's homepage at http://www.ttp.net/
URI: http://www.scientific.net/AMM.404.72
http://dspace.unimap.edu.my:80/dspace/handle/123456789/35387
ISBN: 978-303785845-5
ISSN: 1660-9336
Appears in Collections:Vithyacharan Retnasamy
Zaliman Sauli, Lt. Kol. Professor Dr.
Fairul Afzal Ahmad Fuad
School of Microelectronic Engineering (Articles)
School of Computer and Communication Engineering (Articles)

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