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Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Zaliman, Sauli, Dr. | - |
dc.contributor.author | Retnasamy, Vithyacharan | - |
dc.contributor.author | Fairul Afzal, Ahmad Fuad | - |
dc.contributor.author | Ehkan, Phaklen, Dr. | - |
dc.contributor.author | Muhamad Hafiz, Ab Aziz | - |
dc.date.accessioned | 2014-06-10T09:08:40Z | - |
dc.date.available | 2014-06-10T09:08:40Z | - |
dc.date.issued | 2013 | - |
dc.identifier.citation | Applied Mechanics and Materials, vol. 404, 2013, pages 62-66 | en_US |
dc.identifier.isbn | 978-303785845-5 | - |
dc.identifier.issn | 1660-9336 | - |
dc.identifier.uri | http://www.scientific.net/AMM.404.62 | - |
dc.identifier.uri | http://dspace.unimap.edu.my:80/dspace/handle/123456789/35335 | - |
dc.description | Link to publisher's homepage at http://www.ttp.net/ | en_US |
dc.description.abstract | This paper reports the factors that affect the bump height in electroless nickel immersion gold (ENIG) and their interrelation between each other. Bump height is a critical issue that needs to be investigated because a certain quality and requirements of bump height needs to be achieved prior to reflow oven soldering process. A total of four controllable process variables, with 16 sets of experiments were studied using a systematically designed design of experiment (DOE). The result suggests that the electroless nickel bath time has the most significant effect on the formation on bump height and consequently provide larger area for conductivity. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Trans Tech Publications | en_US |
dc.subject | Bump height | en_US |
dc.subject | DOE | en_US |
dc.subject | ENIG | en_US |
dc.title | Relationship between controllable process parameters on bump height in ENIG | en_US |
dc.type | Article | en_US |
dc.contributor.url | zaliman@unimap.edu.my | en_US |
dc.contributor.url | vc.sundress@gmail.com | en_US |
dc.contributor.url | fairul@unimap.edu.my | en_US |
dc.contributor.url | phaklen@unimap.edu.my | en_US |
dc.contributor.url | muhamadhafiz@unimap.edu.my | en_US |
Appears in Collections: | Vithyacharan Retnasamy Zaliman Sauli, Lt. Kol. Professor Dr. Fairul Afzal Ahmad Fuad School of Microelectronic Engineering (Articles) School of Computer and Communication Engineering (Articles) |
Files in This Item:
File | Description | Size | Format | |
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Relationship between controllable process parameters on bump height in ENIG.pdf | 9.29 kB | Adobe PDF | View/Open |
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