Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/1969
Title: Electrical characterization of 0.15µm CMOS Transistor using TSUPREM-4 and MEDICI
Authors: Low Pooi Lam
Norhawati Ahmad (Advisor)
Keywords: Metal oxide semiconductors, Complementary
CMOS transistors
Transistors
Semiconductors
Silicon
Integrated circuits
Issue Date: Apr-2008
Publisher: Universiti Malaysia Perlis
Abstract: Physical and electrical characteristics of 0.153m Complementary Metal Oxide Semiconductor (CMOS) were studied. Fabrications of the devices were done by TSUPREM-4 simulator and electrical characteristics extraction will done by MEDICI simulator. The scaled parameters are gate length and threshold voltage. The result for electrical characteristics does not show any saturation. There might be due to the effect of Channel Length Modulation and Short Channel Effect.
Description: Access is limited to UniMAP community.
URI: http://dspace.unimap.edu.my/123456789/1969
Appears in Collections:School of Microelectronic Engineering (FYP)

Files in This Item:
File Description SizeFormat 
Abstract, Acknowledgment.pdf146.22 kBAdobe PDFView/Open
Conclusion.pdf87.41 kBAdobe PDFView/Open
Introduction.pdf87.38 kBAdobe PDFView/Open
Literature review.pdf1.02 MBAdobe PDFView/Open
Methodology.pdf4.09 MBAdobe PDFView/Open
References and appendix.pdf104.99 kBAdobe PDFView/Open
Results and discussion.pdf266.91 kBAdobe PDFView/Open


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