Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/1968
Title: Analysis of square shaped Microstructure based Electron Beam induced deposition
Authors: Siti Fatimah Abd. Rahman
Shaiful Nizam Mohyar (Advisor)
Keywords: Electron beams
Scanning electron microscopes
Microelectronics
Microstructure
Issue Date: Apr-2008
Publisher: Universiti Malaysia Perlis
Abstract: The fabrication of square shaped microstructures is studied by electron beam induced deposition (EBID) method using Scanning Electron Microscopy (SEM). EBID is a technique that allows the resistless deposition directly onto the sample substrate. Without using the precursor gas, the square shaped structures are grown in varies of deposition time. The deposition time was controlled from 6 ~ 18 minutes respectively with fixed beam energy 20 kV. In addition, the size, thickness and surface roughness of square shaped structures is studied by using atomic force microscopy (AFM). Increasing the deposition time from 6 ~ 18 minutes will increase the structures thickness from 38.16 nm to 92.08 nm while the rms value for surface roughness will decrease from 2.73 nm to 1.31 nm.
URI: http://dspace.unimap.edu.my/123456789/1968
Appears in Collections:School of Microelectronic Engineering (FYP)

Files in This Item:
File Description SizeFormat 
Abstract, Acknowledgment.pdf38.02 kBAdobe PDFView/Open
Conclusion.pdf17.24 kBAdobe PDFView/Open
Introduction.pdf16.86 kBAdobe PDFView/Open
Literature review.pdf297.45 kBAdobe PDFView/Open
Methodology.pdf1.25 MBAdobe PDFView/Open
References and appendix.pdf16.75 kBAdobe PDFView/Open
Results and discussion.pdf4.14 MBAdobe PDFView/Open


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