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dc.contributor.authorSiti Fatimah Abd. Rahman-
dc.date.accessioned2008-09-05T09:03:09Z-
dc.date.available2008-09-05T09:03:09Z-
dc.date.issued2008-04-
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/1968-
dc.description.abstractThe fabrication of square shaped microstructures is studied by electron beam induced deposition (EBID) method using Scanning Electron Microscopy (SEM). EBID is a technique that allows the resistless deposition directly onto the sample substrate. Without using the precursor gas, the square shaped structures are grown in varies of deposition time. The deposition time was controlled from 6 ~ 18 minutes respectively with fixed beam energy 20 kV. In addition, the size, thickness and surface roughness of square shaped structures is studied by using atomic force microscopy (AFM). Increasing the deposition time from 6 ~ 18 minutes will increase the structures thickness from 38.16 nm to 92.08 nm while the rms value for surface roughness will decrease from 2.73 nm to 1.31 nm.en_US
dc.language.isoenen_US
dc.publisherUniversiti Malaysia Perlisen_US
dc.subjectElectron beamsen_US
dc.subjectScanning electron microscopesen_US
dc.subjectMicroelectronicsen_US
dc.subjectMicrostructureen_US
dc.titleAnalysis of square shaped Microstructure based Electron Beam induced depositionen_US
dc.typeLearning Objecten_US
dc.contributor.advisorShaiful Nizam Mohyar (Advisor)en_US
dc.publisher.departmentSchool of Microelectronic Engineeringen_US
Appears in Collections:School of Microelectronic Engineering (FYP)

Files in This Item:
File Description SizeFormat 
Abstract, Acknowledgment.pdf38.02 kBAdobe PDFView/Open
Conclusion.pdf17.24 kBAdobe PDFView/Open
Introduction.pdf16.86 kBAdobe PDFView/Open
Literature review.pdf297.45 kBAdobe PDFView/Open
Methodology.pdf1.25 MBAdobe PDFView/Open
References and appendix.pdf16.75 kBAdobe PDFView/Open
Results and discussion.pdf4.14 MBAdobe PDFView/Open


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