Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/10178
Title: Electrical properties of pre-alloyed Cu-P containing electrically conductive adhesive
Authors: Ho, Li Ngee
Tang, Fei Wu
Nishikawa, Hiroshi
Takemoto, Tadashi
Keywords: Aging
Copper and alloy
Electrical properties
Phenolic
Issue Date: Aug-2010
Publisher: Taylor & Francis
Citation: Journal of Adhesion, vol. 86(8), August 2010, pages 805-813
Abstract: In this study, a pre-alloyed Cu-P powder with a trace amount of P (0.002 at.%) was used as a metallic filler in a phenolic resin-based electrically conductive adhesive (ECA). The electrical property of the Cu-P-filled ECA was investigated for long-term stability and reliability by aging at high temperature exposure at 125°C and 85°C/85% RH for 1000 h, respectively. Results showed that the electrical resistivity of the Cu-P-filled ECA could be maintained consistently low after high temperature exposure at 125°C for 1000 h or aging at 85°C/85% RH for 1000 h, compared with the rapidly increased resistivity of Cu-filled ECA over time. A significantly low final resistivity at an order of magnitude of 10-4 Ω·cm could be maintained in Cu-P-filled ECA even after aging at 85°C/85% RH for 1000 h.
Description: Link to publisher's homepage at http://www.taylorandfrancisgroup.com/
URI: http://www.informaworld.com/smpp/content~db=all~content=a925212335~frm=titlelink
http://dspace.unimap.edu.my/123456789/10178
ISSN: 0021-8464
Appears in Collections:School of Materials Engineering (Articles)

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