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Title: | Electrical properties of pre-alloyed Cu-P containing electrically conductive adhesive |
Authors: | Ho, Li Ngee Tang, Fei Wu Nishikawa, Hiroshi Takemoto, Tadashi |
Keywords: | Aging Copper and alloy Electrical properties Phenolic |
Issue Date: | Aug-2010 |
Publisher: | Taylor & Francis |
Citation: | Journal of Adhesion, vol. 86(8), August 2010, pages 805-813 |
Abstract: | In this study, a pre-alloyed Cu-P powder with a trace amount of P (0.002 at.%) was used as a metallic filler in a phenolic resin-based electrically conductive adhesive (ECA). The electrical property of the Cu-P-filled ECA was investigated for long-term stability and reliability by aging at high temperature exposure at 125°C and 85°C/85% RH for 1000 h, respectively. Results showed that the electrical resistivity of the Cu-P-filled ECA could be maintained consistently low after high temperature exposure at 125°C for 1000 h or aging at 85°C/85% RH for 1000 h, compared with the rapidly increased resistivity of Cu-filled ECA over time. A significantly low final resistivity at an order of magnitude of 10-4 Ω·cm could be maintained in Cu-P-filled ECA even after aging at 85°C/85% RH for 1000 h. |
Description: | Link to publisher's homepage at http://www.taylorandfrancisgroup.com/ |
URI: | http://www.informaworld.com/smpp/content~db=all~content=a925212335~frm=titlelink http://dspace.unimap.edu.my/123456789/10178 |
ISSN: | 0021-8464 |
Appears in Collections: | School of Materials Engineering (Articles) |
Files in This Item:
File | Description | Size | Format | |
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Electrical properties of pre.pdf | 38.99 kB | Adobe PDF | View/Open |
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