Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/10178
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dc.contributor.authorHo, Li Ngee-
dc.contributor.authorTang, Fei Wu-
dc.contributor.authorNishikawa, Hiroshi-
dc.contributor.authorTakemoto, Tadashi-
dc.date.accessioned2010-11-10T08:48:45Z-
dc.date.available2010-11-10T08:48:45Z-
dc.date.issued2010-08-
dc.identifier.citationJournal of Adhesion, vol. 86(8), August 2010, pages 805-813en_US
dc.identifier.issn0021-8464-
dc.identifier.urihttp://www.informaworld.com/smpp/content~db=all~content=a925212335~frm=titlelink-
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/10178-
dc.descriptionLink to publisher's homepage at http://www.taylorandfrancisgroup.com/en_US
dc.description.abstractIn this study, a pre-alloyed Cu-P powder with a trace amount of P (0.002 at.%) was used as a metallic filler in a phenolic resin-based electrically conductive adhesive (ECA). The electrical property of the Cu-P-filled ECA was investigated for long-term stability and reliability by aging at high temperature exposure at 125°C and 85°C/85% RH for 1000 h, respectively. Results showed that the electrical resistivity of the Cu-P-filled ECA could be maintained consistently low after high temperature exposure at 125°C for 1000 h or aging at 85°C/85% RH for 1000 h, compared with the rapidly increased resistivity of Cu-filled ECA over time. A significantly low final resistivity at an order of magnitude of 10-4 Ω·cm could be maintained in Cu-P-filled ECA even after aging at 85°C/85% RH for 1000 h.en_US
dc.language.isoenen_US
dc.publisherTaylor & Francisen_US
dc.subjectAgingen_US
dc.subjectCopper and alloyen_US
dc.subjectElectrical propertiesen_US
dc.subjectPhenolicen_US
dc.titleElectrical properties of pre-alloyed Cu-P containing electrically conductive adhesiveen_US
dc.typeArticleen_US
Appears in Collections:School of Materials Engineering (Articles)

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