Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/10165
Title: Development of a simultaneously elementary analysis for clay minerals using EDXRF
Authors: Meor Yusoff, M. S.
Masliana, M.
Wilfred, P.
Parimala, Devi
Keywords: EDXRF
Clay minerals
Al
Si
K
Ca
Ti
Fe
International Conference on X-Rays & Related Techniques in Research & Industry (ICXRI)
Issue Date: 9-Jun-2010
Publisher: Universiti Malaysia Perlis
Citation: p.280-289
Series/Report no.: Proceedings of the International Conference on X-Rays & Related Techniques in Research & Industry (ICXRI) 2010
Abstract: The paper relates a study in developing a quantitative elemental analysis for clay minerals by the EDXRF technique. Elements of interest are Al, Si, K, Ca, Ti and Fe. The Regression method involved development of calibration graphs of each of these elements using six different clay minerals reference standards. Straight lines were obtained from these calibration graphs with R2 values ranging from 0.923 to 0.997. The accuracy of this Regression method was then tested by comparing the quantitative analysis result obtained from Fundamental Parameter method using argillaceous limestone reference standard as the sample. Fundamental Parameter method gives a more accurate result than that of the Regression method.
Description: International Conference on X-Rays and Related Techniques in Research and Industry (ICXRI 2010) jointly organized by Universiti Malaysia Perlis (UniMAP) and X-Ray Application Malaysia Society (XAPP), 9th - 10th June 2010 at Aseania Resort Langkawi, Malaysia.
URI: http://dspace.unimap.edu.my/123456789/10165
ISBN: 978-967-5760-02-0
Appears in Collections:Conference Papers

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