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Title: | Development of a simultaneously elementary analysis for clay minerals using EDXRF |
Authors: | Meor Yusoff, M. S. Masliana, M. Wilfred, P. Parimala, Devi |
Keywords: | EDXRF Clay minerals Al Si K Ca Ti Fe International Conference on X-Rays & Related Techniques in Research & Industry (ICXRI) |
Issue Date: | 9-Jun-2010 |
Publisher: | Universiti Malaysia Perlis |
Citation: | p.280-289 |
Series/Report no.: | Proceedings of the International Conference on X-Rays & Related Techniques in Research & Industry (ICXRI) 2010 |
Abstract: | The paper relates a study in developing a quantitative elemental analysis for clay minerals by the EDXRF technique. Elements of interest are Al, Si, K, Ca, Ti and Fe. The Regression method involved development of calibration graphs of each of these elements using six different clay minerals reference standards. Straight lines were obtained from these calibration graphs with R2 values ranging from 0.923 to 0.997. The accuracy of this Regression method was then tested by comparing the quantitative analysis result obtained from Fundamental Parameter method using argillaceous limestone reference standard as the sample. Fundamental Parameter method gives a more accurate result than that of the Regression method. |
Description: | International Conference on X-Rays and Related Techniques in Research and Industry (ICXRI 2010) jointly organized by Universiti Malaysia Perlis (UniMAP) and X-Ray Application Malaysia Society (XAPP), 9th - 10th June 2010 at Aseania Resort Langkawi, Malaysia. |
URI: | http://dspace.unimap.edu.my/123456789/10165 |
ISBN: | 978-967-5760-02-0 |
Appears in Collections: | Conference Papers |
Files in This Item:
File | Description | Size | Format | |
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Development of a....pdf | Access is limited to UniMAP community. | 223.71 kB | Adobe PDF | View/Open |
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