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dc.contributor.authorSaizalmursidi, Md Mustam
dc.contributor.authorMohd Zarar, Mohd Jenu
dc.date.accessioned2010-08-12T07:35:03Z
dc.date.available2010-08-12T07:35:03Z
dc.date.issued2009-06-20
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/8626
dc.descriptionMUCEET 2009 is organized by Malaysian Technical Universities Network (MTUN) comprising of Universiti Malaysia Perlis (UniMAP), Universiti Tun Hussein Onn (UTHM), Universiti Teknikal Melaka (UTeM) and Universiti Malaysia Pahang (UMP), 20th - 22nd June 2009 at M. S. Garden Hotel, Kuantan, Pahang.en_US
dc.description.abstractLow impedance of the return current path and small loop area of return current loop are best practices design criteria to minimise electromagnetic emission from a high speed printed circuit board (PCB). In high-speed digital circuit, the high-frequency return current signal will find its way back to the source by flowing along the path of least inductance. It can either flows over the ground plane or on the guard trace which is physically close proximity to the highspeed signal trace. It is important to indicate that the use of guard trace can be one of the options of emission reduction techniques on double sided assemblies as it will reduce the emission level. In this paper, several double sided test boards were developed to evaluate the impact of different return current paths on radiated emission conducted in a Gigahertz Transverse Electromagnetic (GTEM) cell. Various designs will be presented and important conclusions will be derived.en_US
dc.language.isoenen_US
dc.publisherUniversiti Malaysia Pahang (UMP)en_US
dc.relation.ispartofseriesProceedings of the Malaysian Technical Universities Conference on Engineering and Technology (MUCEET) 2009en_US
dc.subjectElectromagnetic emissionen_US
dc.subjectHigh-speed digital circuiten_US
dc.subjectGuard traceen_US
dc.subjectEmission reductionen_US
dc.subjectMalaysian Technical Universities Conference on Engineering and Technology (MUCEET)en_US
dc.titleExperimental investigation of high-speed digital circuit’s return current on electromagnetic emissionen_US
dc.typeWorking Paperen_US


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