Simulation of shunt capacitor switching transient
Ismael Husein, Almabrouk
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Energization of capacitor banks and shunt reactors has been recognized as a possible source of malfunctions due to the known effect of Switching Transient. Switching transient can produce unwanted high currents with different frequencies that can harm the system in different ways.Modem controlled switching techniques have been developed to reduce switching unwanted effects. Theses modem techniques are based on the fact that if switching operation takes place at a point-on-wave, then it can minimize effectively the effect of switching transient. Theoretically, the controlled switching techniques shall eliminate the switching transients totally. However, current statistics and researches show that the characteristics of the controller and the circuitbreaker itself can affect the success of this method. Therefore, basic understanding of all transients produces during switching process shall be studied taking into consideration all possible parameters and effects. Therefore it was necessary to use the modem computational techniques to solve to a high fidelity nonlinear mathematical model for the transient effect. In this work we used the numerical method applied by A TP software to investigate the transient effect on the quality and quantity of system. Investigations for the cases of Energization inrush, Back to back switching, Outrush Transient, Voltage Magnification and Transient Recovery Voltages was done. The important results are the fact that the transient can be modelled including all parameters and components in such a way that the effect of transient can be minimum. The pivotal identification properties of the transients definitely can be used to improve design characteristics and controlling parameters.