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    Shear ram speed characterization for copper wire bond shear test 

    Zaliman, Sauli, Prof. Madya Dr.; Retnasamy, Vithyacharan; Ahmad Husni, Mohd Shapri; Norazeani, Abdul Rahman; Wan Mokhzani, Wan Norhaimi; Taniselass, Steven; Abdul Halis, Abdul Aziz (Trans Tech Publications, Switzerland., 2012)
    This paper presents the evaluation of the stress and strain response of the copper ball bond during wire bond shear test using finite element analysis. A 3D non-linear finite element model was developed for the simulation. ...
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    Silica microchannel fabrication using fluorine based rie with alas a mask 

    Wan Mokhzani, Wan Norhaimi; Retnasamy, Vithyacharan; Zaliman, Sauli, Assoc. Prof. Dr.; Taniselass, Steven; Ahmad Husni, Mohd Shapri; Norazeani, Abdul Rahman; Abdul Halis, Abdul Aziz (INSInet Publications, 2012-09)
    The silica microchannel fabrication process has been executed with Al thin films as the sacrificial layer during Reactive Ion Etching Process (RIE). CF4/Ar and SF6/Ar plasmas has been used to investigate etch rate of Al ...

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    Abdul Halis, Abdul Aziz (2)
    Ahmad Husni, Mohd Shapri (2)Norazeani, Abdul Rahman (2)Retnasamy, Vithyacharan (2)Taniselass, Steven (2)... View MoreSubjectFabrication process (1)Microfluidics (1)Reactive Ion Etching Process (RIE) (1)Shear ram speed (1)Shear test (1)... View MoreDate Issued2012 (2)

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