| dc.contributor.author | Sundaraj, Kenneth, Prof. Dr. | |
| dc.date.accessioned | 2014-04-08T03:06:33Z | |
| dc.date.available | 2014-04-08T03:06:33Z | |
| dc.date.issued | 2008 | |
| dc.identifier.citation | WSEAS Conferences Computing and computational techniques in sciences Conference, 2008, pages 109-115 | en_US |
| dc.identifier.isbn | 978-960-474-009-3 | |
| dc.identifier.issn | 1790-2769 | |
| dc.identifier.uri | http://dspace.unimap.edu.my:80/dspace/handle/123456789/33476 | |
| dc.description | Link to publisher's homepage at http://www.wseas.org/ | en_US |
| dc.description.abstract | Automated visual inspection (AVI) is becoming an integral part of modern surface mount technology
assembly (SMTa) process. With the increase in demand, high-volume production has to cater for both the quantity
and zero defect quality assurance. A wide range of defect detecting techniques and algorithms have been reported
in the past decade. In this paper, we focus on missing and misalignment defects in SMTa. Thresholding and pixel
frequency summation are some of the techniques which have been used for defect detection. Here, a new approach
using color background subtraction is presented to address the stated defect. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | World Scientific and Engineering Academy and Society | en_US |
| dc.subject | Automated visual inspection (AVI) | en_US |
| dc.subject | Surface Mount Technology assembly (SMTa) | en_US |
| dc.subject | Background subtraction | en_US |
| dc.title | Automated visual inspection for missing or misaligned components in SMT assembly | en_US |
| dc.type | Article | en_US |
| dc.identifier.url | http://www.wseas.us/e-library/conferences/2008/spain/selected/selected12.pdf | |
| dc.contributor.url | kenneth@unimap.edu.my | en_US |
