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dc.contributor.authorMohabattul Zaman, S NS Bukhari, Prof. Madya Ir.
dc.contributor.authorBrabazon D.
dc.contributor.authorM.S.J. Hashmi
dc.date.accessioned2013-12-16T03:50:41Z
dc.date.available2013-12-16T03:50:41Z
dc.date.issued2012-06-18
dc.identifier.citationp. 1240 - 1253en_US
dc.identifier.isbn978-967-5760-11-2
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/30515
dc.descriptionThe 2nd International Malaysia-Ireland Joint Symposium on Engineering, Science and Business 2012 (IMiEJS2012) jointly organized by Universiti Malaysia Perlis and Athlone Institute of Technology in collaboration with The Ministry of Higher Education (MOHE) Malaysia, Education Malaysia and Malaysia Postgraduates Student Association Ireland (MyPSI), 18th - 19th June 2012 at Putra World Trade Center (PWTC), Kuala Lumpur, Malaysia.en_US
dc.description.abstractIn the quest to pack into ever shrinking cell phone, digital audio players or personal digital assistance (PDA), which will definitely helps to ensure the electronic equipment does not overheat, fail or malfunction, nanotechnology researchers keep running up against unpleasant truths, which are higher current density will induce thermomigration as well as electromigration which will damage metal conductors and produce heat that leads to premature failure of the electronic devices. As customers demand more reliable electronics system, it has therefore pushed the electronics manufacturers as well as the electronics industry to the limit of developing smaller and slimmer portable devices. The skills require in developing these “improved and enhanced packages”, must associates with a thorough understanding in Design for Manufacturing (DFM), Failure Mode Effect Analysis (FMEA), materials selection etc. Since early 80‟s, various materials such as Copper, Aluminium, Kovar (Fe-Ni alloy), CuW, CuMo were introduced as electronic packaging materials, but failed due to mismatch in coefficient of thermal expansion (CTE), thermal conductivity or density values between the IC package and the baseplate. Only in the end of the 20th century, metal matrix composite (MMC) such as AlSiC and CuSiC as well as anisotropic composite like AlSiC-TPG have been developed and introduced into market which reported to have better thermal properties. In the 21st century, researches published, suggests that these MMC could be integrated into electronics equipment in order to avoid them from overheat, malfunction or fail. In order to verify this, in this paper, researches have been conducted on CuSiC metal matrix composite (MMC). Two (2) major aspects of studies had been conducted on this composite through powder metallurgy method. Effect of particle size and milling process on the physical, microstructural and thermal properties had been studied, analyses and evaluated. The analysed samples had undergo weighing and mixing, followed by milling process, cold isostatic pressing, sintering, grinding and polishing, density characterization, thermal conductivity testing and particle size characterization. The microstructure obtained from prepared samples had been subjected for Scanning Electron Microscopy (SEM) analysis to check and inspect for any change in particle size, shape as well as formation of agglomeration. It was found that CuSiC composite which is the “new” millennium discovery material, is highly potential thermal management candidate that has good thermal dissipation, light weight and easy-to-process characteristics for application in industry.en_US
dc.language.isoenen_US
dc.publisherUniversiti Malaysia Perlis (UniMAP)en_US
dc.relation.ispartofseriesProceedings of the The 2nd International Malaysia-Ireland Joint Symposium on Engineering, Science and Business 2012 (IMiEJS2012);
dc.subjectThermal managementen_US
dc.subjectNanotechnologyen_US
dc.subjectMetal matrix compositeen_US
dc.subjectCoefficient of thermal expansionen_US
dc.subjectThermal conductivityen_US
dc.subjectAlSiCen_US
dc.subjectCuSiCen_US
dc.subjectElectronic packagingen_US
dc.subjectScanning electron microscopy (SEM)en_US
dc.titleEvaluation on metal matrix composite of CuSiC as candidate for thermal management materials in electronics packagingen_US
dc.typeWorking Paperen_US
dc.contributor.urlmzaman@unimap.edu.myen_US
dc.contributor.urldermot.brabazon@dcu.ieen_US
dc.contributor.urlsaleem.hashmi@dcu.ieen_US


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