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    Algorithm to improve process robustness in the assembly & test manufacturing industry a case study of the 1064nm wavelength laser mark equipment 

    Darin Moreira A/L Anthony Vincent; Bhuvenesh, Prof. Dr. Rajamony (Trans Tech Publications, 2013-09)
    This document explains and demonstrates the generic improvement algorithm created to enhance the maintenance methodology in the semiconductor manufacturing environment. The use of this algorithm demonstrates how a process ...
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    Laser marking equipment process $0 cost productivity improvement 

    Vincent, Darin Moreira Anthony; Rajamony, Bhuvenesh (Institute of Electrical and Electronics Engineers (IEEE), 2014)
    Semiconductor manufacturing in an Assembly and Test Manufacturing (ATM) environment is becoming more challenging with continuous pressure of lowering overall operating cost and striving for perfect quality in the hope of ...
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    Algorithm to improve process robustness in the assembly & test manufacturing industry a case study of the 1064nm wavelength laser mark equipment 

    Anthony Vincent, Darin Moreira; Bhuvenesh, Rajamony (Trans Tech Publications Ltd, 2013-09)
    This document explains and demonstrates the generic improvement algorithm created to enhance the maintenance methodology in the semiconductor manufacturing environment. The use of this algorithm demonstrates how a process ...

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    AuthorAnthony Vincent, Darin Moreira (1)Bhuvenesh, Prof. Dr. Rajamony (1)Bhuvenesh, Rajamony (1)Darin Moreira A/L Anthony Vincent (1)Rajamony, Bhuvenesh (1)... View MoreSubjectCase study (3)IR laser (3)Laser mark (3)
    Quality output (3)
    TRIZ (3)... View MoreDate Issued2014 (1)2013 (2)

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