Now showing items 1-1 of 1

    • XRD analyses of InxGa1-xN (0.20 x 0.80) ternary alloys 

      Yushamdan, Yusof; Muslim, A. Abid; Ng, Sha Shiong; Haslan, Abu Hassan; Zainuriah, Hassan (Universiti Malaysia PerlisSchool of Materials Engineering & School of Environmental Engineering, 2010-06-09)
      We present the structural properties of ternary InxGa1-xN (0.20 x 0.80) alloys grown on sapphire substrate by plasma-assisted molecular beam epitaxy. High resolution X-ray diffraction (HR-XRD) analyses were used ...